INSITU INFRARED VIBRATIONAL STUDY OF THE EARLY STAGES OF SILICON OXIDATION AT THE INTERFACE WITH A NON-AQUEOUS ELECTROLYTE

[1] ABRAHAMS IL, 1987, NEW J CHEM, V11, P157

[2] INFRARED SPECTROELECTROCHEMISTRY [J]. CHEMICAL REVIEWS, 1988, 88 (04) : 673 - 695

[3] THE STUDY OF ADSORBED SPECIES DURING THE PHOTOASSISTED REDUCTION OF CARBON-DIOXIDE AT A P-CDTE ELECTRODE [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1983, 157 (02): : 399 - 404

[4] INFRARED ABSORPTION AT LONGITUDINAL OPTIC FREQUENCY IN CUBIC CRYSTAL FILMS [J]. PHYSICAL REVIEW, 1963, 130 (06): : 2193 - &

[5] ELECTROCHEMICALLY MODULATED INFRARED-SPECTROSCOPY (EMIRS) - EXPERIMENTAL DETAILS [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1984, 160 (1-2): : 47 - 61

[6] Bewick A., 1985, ADV INFRARED RAMAN S, V12, P1

[7] A STUDY OF THIN SILICON DIOXIDE FILMS USING INFRARED-ABSORPTION TECHNIQUES [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) : 4166 - 4172

[8] INFRARED-SPECTROSCOPY OF SI(111) SURFACES AFTER HF TREATMENT - HYDROGEN TERMINATION AND SURFACE-MORPHOLOGY [J]. APPLIED PHYSICS LETTERS, 1988, 53 (11) : 998 - 1000

[9] Chabal Y. J., 1987, Semiconductor Interfaces: Formation and Properties. Proceedings of the Workshop, P301

[10] INSITU FTIR REFLECTION SPECTROSCOPY FOR THE SEMICONDUCTOR ELECTROLYTE INTERFACES [J]. SURFACE SCIENCE, 1986, 175 (03) : 623 - 650

[1] ABRAHAMS IL, 1987, NEW J CHEM, V11, P157

[2] INFRARED SPECTROELECTROCHEMISTRY [J]. CHEMICAL REVIEWS, 1988, 88 (04) : 673 - 695

[3] THE STUDY OF ADSORBED SPECIES DURING THE PHOTOASSISTED REDUCTION OF CARBON-DIOXIDE AT A P-CDTE ELECTRODE [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1983, 157 (02): : 399 - 404

[4] INFRARED ABSORPTION AT LONGITUDINAL OPTIC FREQUENCY IN CUBIC CRYSTAL FILMS [J]. PHYSICAL REVIEW, 1963, 130 (06): : 2193 - &

[5] ELECTROCHEMICALLY MODULATED INFRARED-SPECTROSCOPY (EMIRS) - EXPERIMENTAL DETAILS [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1984, 160 (1-2): : 47 - 61

[6] Bewick A., 1985, ADV INFRARED RAMAN S, V12, P1

[7] A STUDY OF THIN SILICON DIOXIDE FILMS USING INFRARED-ABSORPTION TECHNIQUES [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) : 4166 - 4172

[8] INFRARED-SPECTROSCOPY OF SI(111) SURFACES AFTER HF TREATMENT - HYDROGEN TERMINATION AND SURFACE-MORPHOLOGY [J]. APPLIED PHYSICS LETTERS, 1988, 53 (11) : 998 - 1000

[9] Chabal Y. J., 1987, Semiconductor Interfaces: Formation and Properties. Proceedings of the Workshop, P301

[10] INSITU FTIR REFLECTION SPECTROSCOPY FOR THE SEMICONDUCTOR ELECTROLYTE INTERFACES [J]. SURFACE SCIENCE, 1986, 175 (03) : 623 - 650