学术探索
学术期刊
新闻热点
数据分析
智能评审

NONLINEARITY IN LENGTH MEASUREMENT USING HETERODYNE LASER MICHELSON INTERFEROMETRY

被引：88
作者：
SUTTON, CM
机构：
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1987年 / 20卷 / 10期
关键词：
D O I：
10.1088/0022-3735/20/10/034
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1290 / 1292
页数：3
相关论文
共 8 条
[1]   HETERODYNE INTERFEROMETER TO MEASURE VIBRATION PARAMETERS [J].
BARASH, VY ;
FEDOTOVA, GV .
MEASUREMENT TECHNIQUES USSR, 1984, 27 (01) :50-51
[2]   A STABLE INTERFEROMETER SUPPORTING SYSTEM [J].
BIRCH, KP ;
OKAJI, M .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1986, 19 (05) :361-363
[3]   ZEEMAN LASER INTERFEROMETER [J].
DAHLQUIST, JA ;
PETERSON, DG ;
CULSHAW, W .
APPLIED PHYSICS LETTERS, 1966, 9 (05) :181-+
[4]  
Dukes J. N., 1970, Hewlett-Packard Journal, V21, P2
[5]   LASER HETERODYNE SYSTEM FOR MEASUREMENT AND ANALYSIS OF VIBRATION [J].
EBERHARD.FJ ;
ANDREWS, FA .
JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1970, 48 (03) :603-&
[6]   ANALYSIS OF THE MEASUREMENT ERROR OF THE PARAMETERS OF MECHANICAL VIBRATIONS [J].
FEDOTOVA, GV .
MEASUREMENT TECHNIQUES, 1980, 23 (07) :577-580
[7]  
Quenelle R, 1983, HEWLETT-PACKARD J, V34, P10
[8]   A NEW OPTICAL INTERFEROMETER FOR ABSOLUTE MEASUREMENT OF LINEAR DISPLACEMENT IN THE SUBNANOMETER RANGE [J].
TANAKA, M ;
NAKAYAMA, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1983, 22 (04) :L233-L235
1