CHARGE PUMPING IN SILICON ON INSULATOR STRUCTURES USING GATED P-I-N-DIODES

被引:10
作者
ELEWA, T [1 ]
HADDARA, H [1 ]
CRISTOLOVEANU, S [1 ]
BRUEL, M [1 ]
机构
[1] CEN,LETI,F-38041 GRENOBLE,FRANCE
来源
JOURNAL DE PHYSIQUE | 1988年 / 49卷 / C-4期
关键词
D O I
10.1051/jphyscol:1988426
中图分类号
学科分类号
摘要
引用
收藏
页码:137 / 140
页数:4
相关论文
共 9 条
[1]   DOUBLE-GATE SILICON-ON-INSULATOR TRANSISTOR WITH VOLUME INVERSION - A NEW DEVICE WITH GREATLY ENHANCED PERFORMANCE [J].
BALESTRA, F ;
CRISTOLOVEANU, S ;
BENACHIR, M ;
BRINI, J ;
ELEWA, T .
IEEE ELECTRON DEVICE LETTERS, 1987, 8 (09) :410-412
[2]   CHARGE PUMPING IN MOS DEVICES [J].
BRUGLER, JS ;
JESPERS, PGA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (03) :297-+
[3]  
CHOVET A, 1987, APPL SURF SCI, V30, P390
[4]  
ELEWA T, 1988, E SOI WORKSHOP MEYLA
[5]  
Eliot A. B. M., 1976, SOLID STATE ELECTRON, V19
[6]   PROFILING OF STRESS-INDUCED INTERFACE STATES IN SHORT CHANNEL MOSFETS USING A COMPOSITE CHARGE PUMPING TECHNIQUE [J].
HADDARA, H ;
CRISTOLOVEANU, S .
SOLID-STATE ELECTRONICS, 1986, 29 (08) :767-772
[7]  
HADDARA H, 1986, SOLID STATE ELECTRON, V31, P1077
[8]  
LEE JH, 1986, IEEE ELECTR DEVICE L, V7, P537
[9]  
TACK MR, 1988, E SOI WORKSHOP MEYLA