NEW HIGH-VOLTAGE ATOMIC-RESOLUTION MICROSCOPE APPROACHING 1-ANGSTROM POINT RESOLUTION INSTALLED IN STUTTGART

被引：142

作者：

PHILLIPP, F ^{[1
]}

HOSCHEN, R ^{[1
]}

OSAKI, M ^{[1
]}

MOBUS, G ^{[1
]}

RUHLE, M ^{[1
]}

机构：

[1] JEOL LTD,AKISHIMA,TOKYO 196,JAPAN

来源：

ULTRAMICROSCOPY | 1994年 / 56卷 / 1-3期

关键词：

D O I：

10.1016/0304-3991(94)90141-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The basic characteristics of the new high-voltage atomic resolution microscope (JEOL JEM-ARM1250) recently installed in Stuttgart are described. Owing to its high electrical stability and proper installation conditions this instrument reaches its theoretical point resolution of 0.105 nm at an accelerating voltage of 1250 kV. The defocus spread due to chromatic aberrations was determined quantitatively by extensive diffractogram tests. An information transfer limit between 0.08 and 0.09 nm can be deduced from the results of these tests. First applications are presented, which demonstrate the performance of the instrument in structural studies of various materials.

引用

页码：1 / 10

页数：10

共 32 条

[1]

BANHART F, IN PRESS

[2] DIRECT OBSERVATION OF ATOMIC COLUMNS IN SEMICONDUCTORS BY HREM AT 400 KV [J].