PHASE FORMATION IN CU-SI AND CU-GE

被引:93
作者
HONG, SQ [1 ]
COMRIE, CM [1 ]
RUSSELL, SW [1 ]
MAYER, JW [1 ]
机构
[1] UNIV CAPE TOWN,DEPT PHYS,RONDEBOSCH 7700,SOUTH AFRICA
关键词
D O I
10.1063/1.349213
中图分类号
O59 [应用物理学];
学科分类号
摘要
Phase formation and growth kinetics have been investigated with lateral diffusion couples in Cu-Si and Cu-Ge systems. Analytical electron microscopy was used to determine the crystal structures and chemical compositions of the growing phases. Cu3Si is found to be the dominant phase in the Cu-Si system. The growth of the silicide follows a (time)1/2 dependence with an activation energy of 0.95 eV in the temperature range of 200-260-degrees-C. Cu3Ge is the only phase observed in Cu-Ge lateral diffusion couples with its length up to 20-mu-m. The growth of Cu3Ge is a diffusion controlled process at a rate similar to that of Cu3Si. The activation energy of Cu3Ge growth is 0.94 eV at 200-420-degrees-C. In Cu-silicide or Cu-germanide formation, Cu appears to be the dominant diffusing species.
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页码:3655 / 3660
页数:6
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