DEGRADATION AND ANNEALING CHARACTERISTICS OF AMORPHOUS SILICON-HYDROGEN ALLOYS AFTER A LONG-TIME TEST

被引：8

作者：

TZENG, WJ

TSAI, HK

LEE, SC

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 62卷 / 05期

关键词：

D O I：

10.1063/1.339569

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1856 / 1860

页数：5

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