ELECTRON-PROBE X-RAY-MICROANALYSIS OF SURFACES AND THIN-FILMS

被引：2

作者：

BULPETT, R

机构：

来源：

关键词：

D O I：

10.1016/0042-207X(84)90086-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：481 / 486

页数：6

共 21 条

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