SURFACE DAMAGE OF SINGLE-CRYSTAL SILICON ABRADED IN ETHANOL AND DEIONIZED WATER

被引:8
作者
LIM, DS
DANYLUK, S
机构
[1] Univ of Illinois at Chicago, Dep of, Civil Engineering, Mechanics &, Metallurgy, Chicago, IL, USA, Univ of Illinois at Chicago, Dep of Civil Engineering, Mechanics & Metallurgy, Chicago, IL, USA
关键词
D O I
10.1007/BF00552402
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
16
引用
收藏
页码:4084 / 4090
页数:7
相关论文
共 16 条
[1]   FRACTURE MIRROR FORMATION IN GLASS AND POLYCRYSTALLINE CERAMICS [J].
BANSAL, GK .
PHILOSOPHICAL MAGAZINE, 1977, 35 (04) :935-944
[2]  
CHEN CP, 1980, AM CERAM SOC BULL, V59, P469
[3]   MINIMUM SILICON-WAFER THICKNESS FOR ID WAFERING [J].
CHEN, CP .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (12) :2835-2837
[4]   INFLUENCE OF FLUIDS ON THE ABRASION OF SILICON BY DIAMOND [J].
DANYLUK, S ;
REAVES, R .
WEAR, 1982, 77 (01) :81-87
[5]   COPPER PRECIPITATION ON DISLOCATIONS IN SILICON [J].
DASH, WC .
JOURNAL OF APPLIED PHYSICS, 1956, 27 (10) :1193-1195
[6]   ELECTRON-MICROSCOPE INVESTIGATION OF MICROPLASTIC DEFORMATION MECHANISMS OF SILICON BY INDENTATION [J].
EREMENKO, VG ;
NIKITENK.VI .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1972, 14 (01) :317-330
[7]   MIXED-MODE FRACTURE IN SODA-LIME GLASS [J].
FREIMAN, SW ;
GONZALEZ, AC ;
MECHOLSKY, JJ .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1979, 62 (3-4) :206-208
[8]   EFFECT OF ENVIRONMENT ON PENETRATION OF SURFACE DAMAGE AND REMAINING STRENGTH OF AL2O3 [J].
GRUVER, RM ;
KIRCHNER, HP .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1974, 57 (05) :220-223
[9]   MECHANICS OF STRENGTH-DEGRADING CONTACT FLAWS IN SILICON [J].
LAWN, BR ;
MARSHALL, DB ;
CHANTIKUL, P .
JOURNAL OF MATERIALS SCIENCE, 1981, 16 (07) :1769-1775
[10]   THE INFLUENCE OF FLUIDS ON THE MICROHARDNESS OF SINGLE-CRYSTAL SILICON [J].
LEE, SW ;
LIM, DS ;
DANYLUK, S .
JOURNAL OF MATERIALS SCIENCE LETTERS, 1984, 3 (07) :651-653