HIGH-MAGNETIC-FIELD VANDERPAUW METHOD MAGNETORESISTANCE MEASUREMENT AND APPLICATIONS

被引：5

作者：

MARION, D

CRISTOLOVEANU, S

CHOVET, A

机构：

来源：

IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION | 1982年 / 129卷 / 04期

关键词：

D O I：

10.1049/ip-i-1.1982.0027

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：125 / 130

页数：6

共 23 条

[1]

BEER AC, 1963, SOLID STATE PHYSIC S, V4

[2] GENERALIZED HALL-EFFECT MEASUREMENT GEOMETRIES AND LIMITATIONS OF VAN DER PAUW-TYPE HALL-EFFECT MEASUREMENTS [J].

BOERGER, DM ;

KRAMER, JJ ;

PARTAIN, LD .

JOURNAL OF APPLIED PHYSICS, 1981, 52 (01) :269-274

[3] A HALL 4-POINT PROBE ON THIN PLATES - THEORY AND EXPERIMENT [J].

BUEHLER, MG .

SOLID-STATE ELECTRONICS, 1967, 10 (08) :801-&

[4] SEMICONDUCTOR ABNORMAL MAGNETORESISTANCE RESULTING FROM SURFACE EFFECT FREQUENCY RESPONSE AND CARRIERS EFFECTIVE LIFETIME [J].

CHOVET, A ;

KAMARINOS, G .

REVUE DE PHYSIQUE APPLIQUEE, 1971, 6 (03) :345-+

[5] CONTACT SIZE EFFECTS ON VAN VANDERPAUW METHOD FOR RESISTIVITY AND HALL-COEFFICIENT MEASUREMENT [J].

CHWANG, R ;

SMITH, BJ ;

CROWELL, CR .

SOLID-STATE ELECTRONICS, 1974, 17 (12) :1217-1227

[6] MAGNETOCONCENTRATION AND RELATED GALVANOMAGNETIC EFFECTS IN NON-INTRINSIC SEMICONDUCTORS [J].

CRISTOLOVEANU, S ;

LEE, JH .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1980, 13 (32) :5983-5997

[7] INFLUENCE OF SURFACES ON ETTINGSHAUSEN EFFECT - APPLICATION TO CHARACTERIZATION OF NARROW-GAP SEMICONDUCTORS [J].

CRISTOLOVEANU, S ;

VIKTOROVITCH, P .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 39 (01) :109-116

[8]

DEMEY G, 1974, AEU-INT J ELECTRON C, V28, P335

[9] INFLUENCE OF SAMPLE GEOMETRY ON MAGNETORESISTANCE MEASUREMENTS [J].

DEMEY, G ;

BURVENICH, X ;

DEMOLDER, M .

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1974, 23 (01) :K45-K48

[10]

HORNSTRA J, 1959, J ELECTRON CONTR, V7, P169

← 1 2 3 →