PLENARY LECTURE - LOW-ENERGY ELECTRON-MICROSCOPY OF SURFACE PROCESSES

被引：18

作者：

BAUER, E

MUNDSCHAU, M

SWIECH, W

TELIEPS, W

机构：

[1] Physikalisches Institut, Technische Universität Clausthal

来源：

VACUUM | 1990年 / 41卷 / 1-3期

关键词：

D O I：

10.1016/0042-207X(90)90254-V

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

After a brief discussion of the basic features of low energy electron microscopy, the application of this technique to the study of processes on clean surfaces (Si(111)-(7 × 7)-(1 × 1) phase transition, Si(100) growth and sublimation) and in surface layers (Au and Cu on Si(111) and Mo(110)) is illustrated by video recordings. © 1990 Pergamon Press plc.

引用

收藏

页码：5 / 10

页数：6

相关论文

共 22 条

[1] SURFACE STUDIES BY LOW-ENERGY ELECTRON-MICROSCOPY (LEEM) AND CONVENTIONAL UV PHOTOEMISSION ELECTRON-MICROSCOPY (PEEM) [J].

BAUER, E ;

MUNDSCHAU, M ;

SWIECH, W ;

TELIEPS, W .

ULTRAMICROSCOPY, 1989, 31 (01) :49-57

[2]

BAUER E, 1990, EVALUATION ADV SEMIC, P283

[3]

BAUER E, 1987, SCANNING MICROSCOP S, V1, P99

[4]

BAUER E, 1988, STUDY SURFACES INTER, P195

[5] THE SI(111) 7X7 TO 1X1 TRANSITION [J].

BENNETT, PA ;

WEBB, MW .

SURFACE SCIENCE, 1981, 104 (01) :74-104

[6] STABILITIES OF SINGLE-LAYER AND BILAYER STEPS ON SI(001) SURFACES [J].

CHADI, DJ .

PHYSICAL REVIEW LETTERS, 1987, 59 (15) :1691-1694

[7]

Herring C., 1953, STRUCTURE PROPERTIES, P5

[8] MODIFICATION OF ATOMIC STEPS BY ADSORBATES OBSERVED BY LOW ENERGY ELECTRON MICROSCOPY AND PHOTOEMISSION MICROSCOPY [J].

Mundschau, M. ;

Bauer, E. ;

Swiech, W. .

CATALYSIS LETTERS, 1988, 1 (11) :405-411

[9] INSITU STUDIES OF EPITAXIAL-GROWTH IN THE LOW-ENERGY ELECTRON-MICROSCOPE [J].

MUNDSCHAU, M ;

BAUER, E ;

TELIEPS, W ;

SWIECH, W .

SURFACE SCIENCE, 1989, 213 (2-3) :381-392

[10] DEFECTS ON THE SURFACE OF MO(011) OBSERVED BY LOW-ENERGY ELECTRON-MICROSCOPY [J].

MUNDSCHAU, M ;

BAUER, E ;

SWIECH, W .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1989, 59 (02) :217-226