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SURFACE STATE GENERATION IN MOS STRUCTURE BY APPLYING HIGH-FIELD TO SIO2 FILM
被引:20
作者
:
NAKAGIRI, M
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD,IC DIV,SHIMONUMABE,KAWASAKI,JAPAN
NIPPON ELECT CO LTD,IC DIV,SHIMONUMABE,KAWASAKI,JAPAN
NAKAGIRI, M
[
1
]
机构
:
[1]
NIPPON ELECT CO LTD,IC DIV,SHIMONUMABE,KAWASAKI,JAPAN
来源
:
JAPANESE JOURNAL OF APPLIED PHYSICS
|
1974年
/ 13卷
/ 10期
关键词
:
D O I
:
10.1143/JJAP.13.1610
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:1610 / 1617
页数:8
相关论文
共 9 条
[1]
SURFACE EFFECTS ON P-N JUNCTIONS - CHARACTERISTICS OF SURFACE SPACE-CHARGE REGIONS UNDER NON-EQUILIBRIUM CONDITIONS
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
FITZGERALD, DJ
论文数:
0
引用数:
0
h-index:
0
FITZGERALD, DJ
[J].
SOLID-STATE ELECTRONICS,
1966,
9
(08)
: 783
-
+
[2]
PHYSICAL LIMITATIONS ON FREQUENCY RESPONSE OF A SEMICONDUCTOR SURFACE INVERSION LAYER
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
WARFIELD, G
论文数:
0
引用数:
0
h-index:
0
WARFIELD, G
[J].
SOLID-STATE ELECTRONICS,
1965,
8
(03)
: 321
-
+
[3]
FOWLER-NORDHEIM TUNNELING INTO THERMALLY GROWN SIO2
LENZLINGER, M
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto
LENZLINGER, M
SNOW, EH
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto
SNOW, EH
[J].
JOURNAL OF APPLIED PHYSICS,
1969,
40
(01)
: 278
-
+
[4]
INVESTIGATION OF SILICON-SILICON DIOXIDE INTERFACE USING MOS STRUCTURE
MIURA, Y
论文数:
0
引用数:
0
h-index:
0
MIURA, Y
MATUKURA, Y
论文数:
0
引用数:
0
h-index:
0
MATUKURA, Y
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1966,
5
(02)
: 180
-
&
[5]
SI-SIO2 INTERFACE - ELECTRICAL PROPERTIES AS DETERMINED BY METAL-INSULATOR-SILICON CONDUCTANCE TECHNIQUE
NICOLLIA.EH
论文数:
0
引用数:
0
h-index:
0
NICOLLIA.EH
GOETZBER.A
论文数:
0
引用数:
0
h-index:
0
GOETZBER.A
[J].
BELL SYSTEM TECHNICAL JOURNAL,
1967,
46
(06):
: 1055
-
+
[6]
ELECTROCHEMICAL CHARGING OF THERMAL SIO2 FILMS BY INJECTED ELECTRON CURRENTS
NICOLLIA.EH
论文数:
0
引用数:
0
h-index:
0
NICOLLIA.EH
BERGLUND, CN
论文数:
0
引用数:
0
h-index:
0
BERGLUND, CN
SCHMIDT, PF
论文数:
0
引用数:
0
h-index:
0
SCHMIDT, PF
ANDREWS, JM
论文数:
0
引用数:
0
h-index:
0
ANDREWS, JM
[J].
JOURNAL OF APPLIED PHYSICS,
1971,
42
(13)
: 5654
-
&
[7]
NICOLLIAN EH, 1965, IEEE T ELECTRON DEVI, VED12, P108
[8]
ELECTRICAL-CONDUCTION AND DIELECTRIC BREAKDOWN IN SILICON DIOXIDE FILMS ON SILICON
OSBURN, CM
论文数:
0
引用数:
0
h-index:
0
OSBURN, CM
WEITZMAN, EJ
论文数:
0
引用数:
0
h-index:
0
WEITZMAN, EJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(05)
: 603
-
+
[9]
DIELECTRIC BREAKDOWN IN SILICON DIOXIDE FILMS ON SILICON .2. INFLUENCE OF PROCESSING AND MATERIALS
OSBURN, CM
论文数:
0
引用数:
0
h-index:
0
OSBURN, CM
ORMOND, DW
论文数:
0
引用数:
0
h-index:
0
ORMOND, DW
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(05)
: 597
-
+
←
1
→
共 9 条
[1]
SURFACE EFFECTS ON P-N JUNCTIONS - CHARACTERISTICS OF SURFACE SPACE-CHARGE REGIONS UNDER NON-EQUILIBRIUM CONDITIONS
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
FITZGERALD, DJ
论文数:
0
引用数:
0
h-index:
0
FITZGERALD, DJ
[J].
SOLID-STATE ELECTRONICS,
1966,
9
(08)
: 783
-
+
[2]
PHYSICAL LIMITATIONS ON FREQUENCY RESPONSE OF A SEMICONDUCTOR SURFACE INVERSION LAYER
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
WARFIELD, G
论文数:
0
引用数:
0
h-index:
0
WARFIELD, G
[J].
SOLID-STATE ELECTRONICS,
1965,
8
(03)
: 321
-
+
[3]
FOWLER-NORDHEIM TUNNELING INTO THERMALLY GROWN SIO2
LENZLINGER, M
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto
LENZLINGER, M
SNOW, EH
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto
SNOW, EH
[J].
JOURNAL OF APPLIED PHYSICS,
1969,
40
(01)
: 278
-
+
[4]
INVESTIGATION OF SILICON-SILICON DIOXIDE INTERFACE USING MOS STRUCTURE
MIURA, Y
论文数:
0
引用数:
0
h-index:
0
MIURA, Y
MATUKURA, Y
论文数:
0
引用数:
0
h-index:
0
MATUKURA, Y
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1966,
5
(02)
: 180
-
&
[5]
SI-SIO2 INTERFACE - ELECTRICAL PROPERTIES AS DETERMINED BY METAL-INSULATOR-SILICON CONDUCTANCE TECHNIQUE
NICOLLIA.EH
论文数:
0
引用数:
0
h-index:
0
NICOLLIA.EH
GOETZBER.A
论文数:
0
引用数:
0
h-index:
0
GOETZBER.A
[J].
BELL SYSTEM TECHNICAL JOURNAL,
1967,
46
(06):
: 1055
-
+
[6]
ELECTROCHEMICAL CHARGING OF THERMAL SIO2 FILMS BY INJECTED ELECTRON CURRENTS
NICOLLIA.EH
论文数:
0
引用数:
0
h-index:
0
NICOLLIA.EH
BERGLUND, CN
论文数:
0
引用数:
0
h-index:
0
BERGLUND, CN
SCHMIDT, PF
论文数:
0
引用数:
0
h-index:
0
SCHMIDT, PF
ANDREWS, JM
论文数:
0
引用数:
0
h-index:
0
ANDREWS, JM
[J].
JOURNAL OF APPLIED PHYSICS,
1971,
42
(13)
: 5654
-
&
[7]
NICOLLIAN EH, 1965, IEEE T ELECTRON DEVI, VED12, P108
[8]
ELECTRICAL-CONDUCTION AND DIELECTRIC BREAKDOWN IN SILICON DIOXIDE FILMS ON SILICON
OSBURN, CM
论文数:
0
引用数:
0
h-index:
0
OSBURN, CM
WEITZMAN, EJ
论文数:
0
引用数:
0
h-index:
0
WEITZMAN, EJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(05)
: 603
-
+
[9]
DIELECTRIC BREAKDOWN IN SILICON DIOXIDE FILMS ON SILICON .2. INFLUENCE OF PROCESSING AND MATERIALS
OSBURN, CM
论文数:
0
引用数:
0
h-index:
0
OSBURN, CM
ORMOND, DW
论文数:
0
引用数:
0
h-index:
0
ORMOND, DW
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(05)
: 597
-
+
←
1
→