TERRACING IN STRAINED-LAYER SUPERLATTICES

[11] Neumann D. A., 1985, Layered Structures, Epitaxy, and Interfaces Symposium, P47

[12] X-RAY EVIDENCE FOR A TERRACED GAAS ALAS SUPER-LATTICE [J]. APPLIED PHYSICS LETTERS, 1983, 43 (01) : 59 - 61

[13] OLSEN GH, 1978, CRYSTAL GROWTH THEOR, V2, P1

[14] DETERMINATION OF CRITICAL LAYER THICKNESS IN INXGA1-XAS GAAS HETEROSTRUCTURES BY X-RAY-DIFFRACTION [J]. APPLIED PHYSICS LETTERS, 1987, 50 (15) : 980 - 982

[15] CALCULATION OF CRITICAL LAYER THICKNESS VERSUS LATTICE MISMATCH FOR GEXSI1-X/SI STRAINED-LAYER HETEROSTRUCTURES [J]. APPLIED PHYSICS LETTERS, 1985, 47 (03) : 322 - 324

[11] Neumann D. A., 1985, Layered Structures, Epitaxy, and Interfaces Symposium, P47

[12] X-RAY EVIDENCE FOR A TERRACED GAAS ALAS SUPER-LATTICE [J]. APPLIED PHYSICS LETTERS, 1983, 43 (01) : 59 - 61

[13] OLSEN GH, 1978, CRYSTAL GROWTH THEOR, V2, P1

[14] DETERMINATION OF CRITICAL LAYER THICKNESS IN INXGA1-XAS GAAS HETEROSTRUCTURES BY X-RAY-DIFFRACTION [J]. APPLIED PHYSICS LETTERS, 1987, 50 (15) : 980 - 982

[15] CALCULATION OF CRITICAL LAYER THICKNESS VERSUS LATTICE MISMATCH FOR GEXSI1-X/SI STRAINED-LAYER HETEROSTRUCTURES [J]. APPLIED PHYSICS LETTERS, 1985, 47 (03) : 322 - 324