ATOMIC RESOLUTION ATOMIC FORCE MICROSCOPY OF GRAPHITE AND THE NATIVE OXIDE ON SILICON

被引：66

作者：

MARTI, O

DRAKE, B

GOULD, S

HANSMA, PK

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575427

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：287 / 290

页数：4

共 36 条

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