A CONTRIBUTION TO THE STUDY OF POISSON RATIOS AND ELASTIC-CONSTANTS OF TIN, ZRN AND HFN

被引:115
作者
PERRY, AJ
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D O I
10.1016/S0040-6090(05)80056-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The elastic constants of the group IVB nitrides TiN, ZrN and HfN have been studied by X-ray residual stress measurements. Films of the nitrides were deposited onto stainless steel substrates by reactive sputtering and then vacuum annealed. They were studied using Cr K-alpha-radiation and the five available diffraction peaks (111) to (222). Poisson's ratios for bulk material are 0.30, 0.19 and 0.35 for the three nitrides respectively, indicating that the first and last are nearly isotropic which requires v to be 1/3. Values of the X-ray elastic constants and anisotropy factors were also derived.
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页码:463 / 471
页数:9
相关论文
共 22 条
[1]  
BEHNKEN H, 1986, Z METALLKD, V77, P620
[2]  
BOLLENRATH F, 1967, Z METALLKD, V58, P76
[3]   RESIDUAL-STRESS ANISOTROPY, STRESS-CONTROL, AND RESISTIVITY IN POST CATHODE MAGNETRON SPUTTER DEPOSITED MOLYBDENUM FILMS [J].
CUTHRELL, RE ;
MATTOX, DM ;
PEEPLES, CR ;
DREIKE, PL ;
LAMPPA, KP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (05) :2914-2920
[4]   LOW-TEMPERATURE TEMPERING-INDUCED CHANGES IN BULK RESISTIVITY, TEMPERATURE-COEFFICIENT OF RESISTIVITY AND STRESS IN PHYSICALLY VAPOR-DEPOSITED TIN [J].
ERNSBERGER, C ;
PERRY, AJ ;
LEHMAN, LP ;
MILLER, AE ;
PELTON, AR ;
DABROWSKI, BW .
SURFACE & COATINGS TECHNOLOGY, 1988, 36 (3-4) :605-616
[5]   SEEMAN-BOHLIN X-RAY DIFFRACTOMETER FOR THIN FILMS [J].
FEDER, R ;
BERRY, BS .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 (OCT1) :372-&
[6]  
FILLIT RY, 1990, THIN SOLID FILMS
[7]  
Frantsevioh I. N., 1967, IAN SSSR NEORG MATER, V3, P6
[9]   RESIDUAL-STRESSES AND RESIDUAL-STRESS DISTRIBUTIONS IN TICN-COATED AND TIN-COATED STEELS [J].
HIRSCH, T ;
MAYR, P .
SURFACE & COATINGS TECHNOLOGY, 1988, 36 (3-4) :729-741
[10]   PHONON ANOMALIES IN TRANSITION-METAL NITRIDES - TIN [J].
KRESS, W ;
ROEDHAMMER, P ;
BILZ, H ;
TEUCHERT, WD ;
CHRISTENSEN, AN .
PHYSICAL REVIEW B, 1978, 17 (01) :111-113