OBSERVATION OF HIGH ELECTRON-EMISSION YIELDS FOLLOWING HIGHLY CHARGED ION IMPACT (UP TO TH(75+)) ON SURFACES

被引：49

作者：

MCDONALD, JW ^{[1
]}

SCHNEIDER, D ^{[1
]}

CLARK, MW ^{[1
]}

DEWITT, D ^{[1
]}

机构：

[1] UNIV TEXAS,DEPT PHYS,AUSTIN,TX 78712

来源：

PHYSICAL REVIEW LETTERS | 1992年 / 68卷 / 15期

关键词：

D O I：

10.1103/PhysRevLett.68.2297

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Doubly differential electron emission yields following the impact of fast (3.95 x 10(7) cm/sec) Ar9,12,18+, Ne9+, Xe30,44+, and Th70.75+ ions on Cu and Au targets have been measured. The electron emission is dominated by low-energy electrons (< 50 eV). It is found that the total yield, which rises to about 100 electrons per ion, is a nonlinear function of the total potential energy of the incident ion (up to about 200 keV).

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页码：2297 / 2300

页数：4

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