共 16 条
- [1] ATOM-RESOLVED IMAGING AND SPECTROSCOPY ON THE GAAS(001) SURFACE USING TUNNELING MICROSCOPY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1992, 10 (04): : 1881 - 1885
- [2] SCANNING TUNNELING MICROSCOPY STUDIES OF SEMICONDUCTOR SURFACE PASSIVATION [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (3B): : 1484 - 1492
- [3] PASSIVATION OF GAAS(001) SURFACES BY INCORPORATION OF GROUP-VI ATOMS - A STRUCTURAL INVESTIGATION [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (04): : 2256 - 2262
- [6] REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION CHARACTERISTIC ABSENCES IN GAAS(100) (2X4)-AS - A TOOL FOR DETERMINING THE SURFACE STOICHIOMETRY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (04): : 903 - 907
- [9] FIELD ION-SCANNING TUNNELING MICROSCOPE EQUIPPED WITH MOLECULAR-BEAM EPITAXY AND ITS APPLICATION TO STUDY SEMICONDUCTOR SURFACE-STRUCTURE [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (3B): : 1508 - 1510
- [10] CONTRASTS IN THE REACTIONS OF SULFUR FROM DIFFERENT SOURCES WITH GAAS-SURFACES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 1374 - 1378