共 14 条
[2]
TUNNELING MICROSCOPY OF SILICON AND GERMANIUM - SI(111) 7X7, SNGE(111) 7X7, GESI(111) 5X5, SI(111) 9X9, GE(111) 2X8, GE(100) 2X1, SI(110) 5X1
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1988, 6 (02)
:472-477
[3]
MEASUREMENT OF SURFACE-DEFECTS BY LOW-ENERGY ELECTRON-DIFFRACTION
[J].
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,
1984, 34 (04)
:205-214
[5]
LEED STUDIES OF SURFACE IMPERFECTIONS
[J].
APPLICATIONS OF SURFACE SCIENCE,
1982, 11-2 (JUL)
:450-469
[6]
HORN B, 1988, J VAC SCI TECHNOL B, V6, P727
[8]
HORN M, 1988, THESIS HANNOVER
[9]
KNIBB MG, 1988, PHYSICS, V18, P43
[10]
KOHLER U, 1989, J VAC SCI TECHNOL A, V7, P2860, DOI 10.1116/1.576159