CHARGE EFFECTS DURING SURFACE-ANALYSIS OF POORLY CONDUCTING INORGANIC MATERIALS

The properties of surfaces and interfaces often determine the behaviour of materials in a given application: typical examples are all kinds of corrosion, segregation, sensor activity, wear and friction, adhesion of coatings, joining processes, sintering, etc. It is the aim of this paper to provide materials scientists with a better understanding of the limits of applying modern surface analysis methods (SIMS, AES, etc.) to materials with low room temperature electrical conductivity like most ceramics and glasses. One feature common to all methods deserves special attention: this is the influence of surface and near surface charges on the distribution of mobile ionic species in the near surface region of the sample to be analyzed. The origin of these charges and their order of magnitude as a function of the experimental parameters can be deduced from charge balance considerations: the main result is that "self-compensating" methods should be most favorable.