SIMS ANALYSIS OF POORLY CONDUCTING SURFACES

被引：9

作者：

BORCHARDT, G ^{[1
]}

SCHERRER, S ^{[1
]}

WEBER, S ^{[1
]}

机构：

[1] ECOLE MINES NANCY,PHYS SOLIDE LAB,UA 155,F-54042 NANCY,FRANCE

来源：

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1987年 / 329卷 / 2-3期

关键词：

D O I：

10.1007/BF00469123

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：129 / 132

页数：4

共 16 条

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[3]

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[4] USE OF A FAST ATOM BEAM IN ION MICROSCOPY (FABIM) FOR ANALYSIS OF POORLY CONDUCTING MATERIALS [J].

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LANG, JM .

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WERNER, HW .

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[7] THE DEPTH PROFILING OF GLASS SURFACES BY MASS-SPECTROMETRY USING NEUTRAL-PARTICLE BOMBARDMENT [J].

IINO, A ;

MIZUIKE, A .

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[8]

MCCAUGHAN DV, 1974, CHARACTERIZATION SOL, P627

[9]

OECHSNER H, 1986, 1986 ANG OB KAIS

[10]

RICHTER T, 1985, PHYS CHEM GLASSES, V26, P208

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