NEGATIVE-ION SOURCE FOR IMPLANTATION AND SURFACE INTERACTION OF NEGATIVE-ION BEAMS

被引:30
作者
ISHIKAWA, J
机构
[1] Department of Electronics, Kyoto University, Sakyo-ku
关键词
D O I
10.1063/1.1144984
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An rf-plasma-sputter type heavy negative-ion source can deliver a few mA to 12 mA of dc negative-ion currents such as boron, carbon, silicon, and copper negative-ion beams. These negative-ion currents are comparable with the positive-ion currents for conventional high current positive-ion implantation, and thus could be newly used in place of positive ions. Surface interaction of negative-ion beams is extremely distinctive when negative ions are implanted into insulated materials or insulators. The surface charge-up voltage of insulated materials by negative-ion implantation saturates at only several volts, so that no breakdown of insulators takes place. As a whole system, a negative-ion implanter without charge neutralizer would be simpler and more economical than a positive-ion implanter.
引用
收藏
页码:1290 / 1294
页数:5
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