NUMERICAL-SIMULATION OF INTRINSIC BISTABILITY AND HIGH-FREQUENCY CURRENT OSCILLATIONS IN RESONANT TUNNELING STRUCTURES

被引:151
作者
JENSEN, KL
BUOT, FA
机构
[1] Naval Research Laboratory, Washington
关键词
D O I
10.1103/PhysRevLett.66.1078
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Intrinsic high-frequency oscillations (almost-equal-to 2.5 THz) in current and corresponding quantum-well density have been simulated for the first time for a fixed-bias voltage in the negative differential resistance (NDR) region of the current-voltage (I-V) characteristics of a resonant tunneling diode. Scattering and self-consistency are included. Hysteresis and "plateaulike" behavior of the time-averaged I-V curve are simulated in the NDR region. Intrinsic bistability is manifested by the phenomenon of unstable electron charge buildup and ejection from the quantum well.
引用
收藏
页码:1078 / 1081
页数:4
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