FAILURE MECHANISMS IN II-VI BLUE-GREEN EMITTERS

被引：7

作者：

GUHA, S

CHENG, H

DEPUYDT, JM

HAASE, MA

QIU, J

机构：

[1] Photonics Research Laboratory, 3M Company 3M Center, St. Paul, MN 55144-1000

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1994年 / 28卷 / 1-3期

关键词：

LIGHT-EMITTING DIODES; II-VI EMITTERS; TRANSMISSION ELECTRON MICROSCOPY;

D O I：

10.1016/0921-5107(94)90009-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Wide-gap II-IV-based blue and blue-green light-emitting diodes and lasers are limited by the problem of device lifetime and degradation. It is shown that the devices degrade owing to the formation and propagation of defects in the active region of the device that act as non-radiative recombination centers. Through transmission electron microscopy, electroluminescence and cathodoluminescence microscopy, the formation and nature of these defects were studied.

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页码：29 / 35

页数：7

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