DEGRADATION OF II-VI BASED BLUE-GREEN LIGHT EMITTERS

被引:224
作者
GUHA, S
DEPUYDT, JM
HAASE, MA
QIU, J
CHENG, H
机构
[1] Photonics Research Laboratory, 3M Company, 3M Center, St. Paul, MN 55144-1000
关键词
D O I
10.1063/1.110218
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have carried out the first detailed structural studies of degradation in II-VI blue-green light emitters. Electroluminescence and transmission electron microscopy studies carried out on light emitting diodes fabricated from quantum well laser structures and electroluminescence studies on stripe laser structures show that degradation occurs by the formation and propagation of crystal defects. The studies indicate that room temperature cw lasing in such structures is possibly prevented by the rapid formation of such defects at the high current densities required for lasing.
引用
收藏
页码:3107 / 3109
页数:3
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