LOW-TEMPERATURE ELECTROPLATED AU-SNNI-AU OHMIC CONTACTS ON N-TYPE GAAS

被引:3
作者
KELLY, WM
WRIXON, GT
机构
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D O I
10.1049/el:19780054
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:80 / 81
页数:2
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共 10 条
[1]  
BONDOIS A, 1977, THESIS U P M CURIE
[2]   CHARACTERIZATION OF EVAPORATED GOLD-INDIUM FILMS ON SEMICONDUCTORS [J].
FINSTAD, TG ;
ANDREASSEN, T ;
OLSEN, T .
THIN SOLID FILMS, 1975, 29 (01) :145-154
[3]  
Healy M. P., 1976, IEEE Transactions on Electron Devices, VED-23
[4]   VERY LOW RESISTANCE NI-AUGE-NI CONTACTS TO N-GAAS [J].
HEIME, K ;
KONIG, U ;
KOHN, E ;
WORTMANN, A .
SOLID-STATE ELECTRONICS, 1974, 17 (08) :835-&
[5]   VARIATION OF CONTACT RESISTANCE OF METAL-GAAS CONTACTS WITH IMPURITY CONCENTRATION AND ITS DEVICE IMPLICATION [J].
KLOHN, KL ;
WANDINGE.L .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (04) :507-&
[6]  
LOWENHEIM FA, 1973, METAL FINISHING GUID
[7]   CONTACT RESISTANCES OF SEVERAL METALS AND ALLOYS TO GAAS [J].
MATINO, H ;
TOKUNAGA, M ;
HERRICK, IW ;
ADAMS, MF .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (05) :709-&
[8]   METALLIC CONTACTS FOR GALLIUM ARSENIDE [J].
PAOLA, CR .
SOLID-STATE ELECTRONICS, 1970, 13 (08) :1189-+
[9]   METALLURGICAL AND ELECTRICAL PROPERTIES OF ALLOYED NI-AU-GE FILMS ON N-TYPE GAAS [J].
ROBINSON, GY .
SOLID-STATE ELECTRONICS, 1975, 18 (04) :331-&
[10]  
YOKOYAMA Y, 1975, JAPAN J APPL PHYS, V14, P1071