THE PHYSICS OF THE HIGH-RESOLUTION SCANNING MICROSCOPE

被引:22
作者
CREWE, AV [1 ]
机构
[1] UNIV CHICAGO,ENRICO FERMI INST,CHICAGO,IL 60637
关键词
D O I
10.1088/0034-4885/43/5/002
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
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页码:621 / &
相关论文
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