A MOLECULAR-DYNAMICS SIMULATION STUDY OF THE INFLUENCE OF THE ION MASS UPON ATOM EJECTION PROCESSES

被引:17
作者
HARRISON, DE
机构
关键词
D O I
10.1063/1.329277
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:4251 / 4258
页数:8
相关论文
共 26 条
  • [21] THOMPSON DA, 1981, J APPL PHYS, V53, P982
  • [22] THOMPSON DA, 1980, P S SPUTTERING, P62
  • [23] PARTICLE EJECTION FROM ION-BOMBARDED CLEAN AND REACTED SINGLE-CRYSTAL SURFACES
    WINOGRAD, N
    GARRISON, BJ
    FLEISCH, T
    DELGASS, WN
    HARRISON, DE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02): : 629 - 634
  • [24] EVIDENCE FOR A RECOMBINATION MECHANISM OF CLUSTER EMISSION FROM ION BOMBARDED METAL-SURFACES
    WINOGRAD, N
    FOLEY, KE
    GARRISON, BJ
    HARRISON, DE
    [J]. PHYSICS LETTERS A, 1979, 73 (03) : 253 - 255
  • [25] STRUCTURE SENSITIVE FACTORS IN MOLECULAR CLUSTER FORMATION BY ION-BOMBARDMENT OF SINGLE-CRYSTAL SURFACES
    WINOGRAD, N
    HARRISON, DE
    GARRISON, BJ
    [J]. SURFACE SCIENCE, 1978, 78 (02) : 467 - 477
  • [26] MECHANISM OF CLUSTER EMISSION IN SPUTTERING
    WITTMAACK, K
    [J]. PHYSICS LETTERS A, 1979, 69 (05) : 322 - 325