GROWTH OF INGAAS/GAAS HETEROSTRUCTURES WITH ABRUPT INTERFACES ON THE MONOLAYER SCALE

被引:10
作者
GERARD, JM [1 ]
D'ANTERROCHES, C [1 ]
机构
[1] FRANCE TELECOM, CTR NATL ETUD TELECOMMUN, CTR NORBERT SEGARD, F-38243 MEYLAN, FRANCE
关键词
D O I
10.1016/0022-0248(94)00744-6
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Segregation processes entail severe deviations from the nominal composition profiles of heterostructures grown by molecular beam epitaxy for most semiconductor systems. It is, however, possible to compensate exactly these effects, as shown here for InGaAs/GaAs. The deposition of a one-monolayer-thick indium-rich prelayer of InGaAs (or of a sub-monolayer amount of InAs) prior to growth of InxGa1-xAs allows forming a perfectly abrupt InxGa1-xAs-on-GaAs interface. Thermal annealing can furthermore be performed at the GaAs-on-InGaAs interface, so as to desorb surface indium atoms and suppress In incorporation in the GaAs overlayer. This powerful approach has been validated from a detailed study of the surface composition at various stages of the growth of InGaAs/GaAs quantum wells, as well as from high-resolution transmission electron microscopy and photoluminescence investigations.
引用
收藏
页码:467 / 472
页数:6
相关论文
共 10 条
[1]   STRUCTURAL AND OPTICAL-PROPERTIES OF (100) INAS SINGLE-MONOLAYER QUANTUM-WELLS IN BULKLIKE GAAS GROWN BY MOLECULAR-BEAM EPITAXY [J].
BRANDT, O ;
TAPFER, L ;
CINGOLANI, R ;
PLOOG, K ;
HOHENSTEIN, M ;
PHILLIPP, F .
PHYSICAL REVIEW B, 1990, 41 (18) :12599-12606
[2]   INSITU PROBING AT THE GROWTH TEMPERATURE OF THE SURFACE-COMPOSITION OF (INGA)AS AND (INAL)AS [J].
GERARD, JM .
APPLIED PHYSICS LETTERS, 1992, 61 (17) :2096-2098
[3]   MONOLAYER-SCALE OPTICAL INVESTIGATION OF SEGREGATION EFFECTS IN SEMICONDUCTOR HETEROSTRUCTURES [J].
GERARD, JM ;
MARZIN, JY .
PHYSICAL REVIEW B, 1992, 45 (11) :6313-6316
[4]   GROWTH OF INGAAS/GAAS QUANTUM-WELLS WITH PERFECTLY ABRUPT INTERFACES BY MOLECULAR-BEAM EPITAXY [J].
GERARD, JM ;
LEROUX, G .
APPLIED PHYSICS LETTERS, 1993, 62 (26) :3452-3454
[5]   HIGH-RESOLUTION INSITU MEASUREMENT OF THE SURFACE-COMPOSITION OF INXGA1-XAS AND INXAL1-XAS AT GROWTH TEMPERATURE [J].
GERARD, JM .
JOURNAL OF CRYSTAL GROWTH, 1993, 127 (1-4) :981-985
[6]   EXPERIMENTAL-EVIDENCE OF DIFFERENCE IN SURFACE AND BULK COMPOSITIONS OF ALXGA1-XAS, ALXIN1-XAS AND GAXIN1-XAS EPITAXIAL LAYERS GROWN BY MOLECULAR-BEAM EPITAXY [J].
MASSIES, J ;
TURCO, F ;
SALETES, A ;
CONTOUR, JP .
JOURNAL OF CRYSTAL GROWTH, 1987, 80 (02) :307-314
[7]   SURFACE SEGREGATION OF 3RD-COLUMN IN GROUP III-V ARSENIDE COMPOUNDS - TERNARY ALLOYS AND HETEROSTRUCTURES [J].
MOISON, JM ;
GUILLE, C ;
HOUZAY, F ;
BARTHE, F ;
VANROMPAY, M .
PHYSICAL REVIEW B, 1989, 40 (09) :6149-6162
[8]   SURFACE SEGREGATION OF IN ATOMS DURING MOLECULAR-BEAM EPITAXY AND ITS INFLUENCE ON THE ENERGY-LEVELS IN INGAAS/GAAS QUANTUM-WELLS [J].
MURAKI, K ;
FUKATSU, S ;
SHIRAKI, Y ;
ITO, R .
APPLIED PHYSICS LETTERS, 1992, 61 (05) :557-559
[9]   INDIUM SURFACE SEGREGATION IN STRAINED GAINAS QUANTUM-WELLS GROWN ON GAAS BY MBE [J].
NAGLE, J ;
LANDESMAN, JP ;
LARIVE, M ;
MOTTET, C ;
BOIS, P .
JOURNAL OF CRYSTAL GROWTH, 1993, 127 (1-4) :550-554
[10]  
SCHNEIDER H, 1991, APPL PHYS LETT, V58, P1551