DETERMINATION OF ELECTRON-ENERGY DISTRIBUTIONS AT LOW-ENERGY

被引：4

作者：

FEDAK, DG ^{[1
]}

机构：

[1] ESSO RES & ENGN CO, CORPORATE RES LABS, Linden, NJ 07036 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1973年 / 44卷 / 11期

关键词：

D O I：

10.1063/1.1686010

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：1613 / 1615

页数：3

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[1] COMMENTS ON A SECONDARY-EMISSION ANALOG FOR IMPROVED AUGER SPECTROSCOPY WITH RETARDING POTENTIAL ANALYZERS [J].

ABBATI, I ;

BRAICOVICH, L .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (07) :1054-+

[2] SECONDARY EMISSION ANALOG FOR IMPROVED AUGER SPECTROSCOPY WITH RETARDING POTENTIAL ANALYZERS [J].

SICKAFUS, EN .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (07) :933-&

[3] RESOLUTION AND SENSITIVITY CONSIDERATIONS OF AN AUGER ELECTRON SPECTROMETER BASED ON DISPLAY LEED OPTICS [J].

TAYLOR, NJ .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) :792-&

[4] USE OF LEED APPARATUS FOR DETECTION AND IDENTIFICATION OF SURFACE CONTAMINANTS [J].

WEBER, RE ;

PERIA, WT .

JOURNAL OF APPLIED PHYSICS, 1967, 38 (11) :4355-&