FABRICATION OF METALLIC NANOWIRES WITH A SCANNING TUNNELING MICROSCOPE

被引:76
作者
KRAMER, N
BIRK, H
JORRITSMA, J
SCHONENBERGER, C
机构
[1] UNIV TWENTE,ENSCHEDE,NETHERLANDS
[2] PHILIPS RES LABS,5656 AA EINDHOVEN,NETHERLANDS
关键词
D O I
10.1063/1.113230
中图分类号
O59 [应用物理学];
学科分类号
摘要
A procedure to pattern thin metal films on a nanometer scale with a scanning tunneling microscope (STM) operating in air is reported. A 30 nm film of hydrogenated amorphous silicon (a-Si:H) is deposited on a 10 nm film of TaIr. Applying a negative voltage between the STM tip and the a-Si:H film causes the local oxidation of a-Si:H. The oxide which is formed is used as a mask to wet etch the not-oxidized a-Si:H and subsequently, the remaining pattern is transferred into the metal film by Ar ion milling. Metal wires as narrow as 40 nm have been fabricated. Since a-Si:H can be deposited in very thin layers on almost any substrate, the presented procedure can be applied to structure all kind of thin films on a nanometer scale.© 1995 American Institute of Physics.
引用
收藏
页码:1325 / 1327
页数:3
相关论文
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