CARRIER LIFETIMES AND THRESHOLD CURRENTS IN HGCDTE DOUBLE HETEROSTRUCTURE AND MULTIQUANTUM-WELL LASERS

被引:37
作者
JIANG, Y
TEICH, MC
WANG, WI
机构
[1] Department of Electrical Engineering, Columbia University, New York
关键词
D O I
10.1063/1.347676
中图分类号
O59 [应用物理学];
学科分类号
摘要
The Auger and radiative combination carrier lifetimes in HgCdTe bulk and quantum-well structures, with band gaps in the wavelength range 2-5-mu-m, are calculated. The Auger recombination rate in a HgCdTe quantum well (QW) is shown to be significantly smaller than that in bulk material. Threshold current densities of HgCdTe double-heterostructure (DH) and multiquantum-well (MQW) lasers are calculated. In a HgCdTe DH laser, Auger recombination dominates the carrier loss at threshold. In a HgCdTe MQW laser, on the other hand, radiative recombination dominates the carrier loss. MQW lasers shown improved temperature performance over conventional DH lasers.
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页码:6869 / 6875
页数:7
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