INFRARED ELLIPSOMETRY STUDY OF THE VIBRATIONAL PROPERTIES OF A-SI-H, A-SIC-H AND A-SIGE-H ULTRATHIN FILMS

被引:4
作者
BENFERHAT, R
DREVILLON, B
机构
关键词
D O I
10.1016/0022-3093(87)90200-6
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:835 / 838
页数:4
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共 11 条
[1]   INSITU INVESTIGATION OF THE GROWTH OF RF GLOW-DISCHARGE DEPOSITED AMORPHOUS-GERMANIUM AND SILICON FILMS [J].
ANTOINE, AM ;
DREVILLON, B ;
CABARROCAS, PRI .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (07) :2501-2508
[2]  
ANTOINE AM, 1986, 7TH P EUR C PHOT SOL, P609
[3]  
ANTOINE AM, 1987, J NONCRYSTALLINE S 2, V97, P835
[4]  
BENFERHAT R, IN PRESS THIN SOLID
[5]   FAST POLARIZATION MODULATED ELLIPSOMETER USING A MICROPROCESSOR SYSTEM FOR DIGITAL FOURIER-ANALYSIS [J].
DREVILLON, B ;
PERRIN, J ;
MARBOT, R ;
VIOLET, A ;
DALBY, JL .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1982, 53 (07) :969-977
[6]  
DREVILLON B, IN PRESS
[7]   LOCAL BONDING OF HYDROGEN IN A-SI H, A-GE H AND A-SI, GE H ALLOY-FILMS [J].
LUCOVSKY, G .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1985, 76 (01) :173-186
[8]   CHEMICAL EFFECTS ON THE FREQUENCIES OF SI-H VIBRATIONS IN AMORPHOUS SOLIDS [J].
LUCOVSKY, G .
SOLID STATE COMMUNICATIONS, 1979, 29 (08) :571-576
[9]   IR SPECTROSCOPY AND STRUCTURE OF RF MAGNETRON SPUTTERED A-SIC-H FILMS [J].
RUBEL, H ;
SCHRODER, B ;
FUHS, W ;
KRAUSKOPF, J ;
RUPP, T ;
BETHGE, K .
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1987, 139 (01) :131-143
[10]  
SCHIMDT MP, 1985, J NONCRYST SOLIDS, V77, P849