A CRITIQUE OF PEAK-FITTING IN GE SPECTROSCOPY USING THE 80-KV DOUBLET OF BA-133 AS EXAMPLE

被引：6

作者：

CAMPBELL, JL

机构：

来源：

INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES | 1982年 / 33卷 / 08期

关键词：

D O I：

10.1016/0020-708X(82)90066-7

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

引用

页码：661 / 665

页数：5

共 6 条

[1] ANALYTIC FITTING OF FULL ENERGY PEAKS FROM GE(LI) AND SI(LI) PHOTON DETECTORS .2.
CAMPBELL, JL
JORCH, HH
[J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 159 (01): : 163 - 170
[2] CHAUVENET B, 1980, ICRMS6 REP
[3] ANALYTICAL FUNCTIONS FOR FITTING PEAKS FROM GE SEMICONDUCTOR-DETECTORS
HELMER, RG
LEE, MA
[J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 178 (2-3): : 499 - 512
[4] AUTOMATIC-ANALYSIS OF GAMMA-RAY SPECTRA FROM GERMANIUM DETECTORS
PHILLIPS, GW
MARLOW, KW
[J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 137 (03): : 525 - 536
[5] FITTING TECHNIQUES FOR K-X-RAY MULTIPLETS IN GE(LI) SPECTRA
SCHULTE, CW
JORCH, HH
CAMPBELL, JL
[J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 174 (03): : 549 - 553
[6] MEASURE OF DEGREE OF FIT BETWEEN CALCULATED AND OBSERVED SPECTRA
SEKINE, T
BABA, H
[J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 133 (01): : 171 - 173