DIELECTRIC LOSS, ELECTRODE DETERIORATION, AND SODIUM PROBLEM IN MOS STRUCTURES

被引：8

作者：

SILVERSMITH, DJ

机构：

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1972年 / 119卷 / 01期

关键词：

D O I：

10.1149/1.2404117

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：121 / +

页数：1

共 12 条

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[4]

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[10] IONIC CONTAMINATION AND TRANSPORT OF MOBILE IONS IN MOS STRUCTURES [J].

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SILVERSMITH, DJ .

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