XPS STUDY OF NON-BRIDGING OXYGENS IN NA2O-SIO2 GELS

被引：29

作者：

NASU, H ^{[1
]}

HEO, J ^{[1
]}

MACKENZIE, JD ^{[1
]}

机构：

[1] UNIV CALIF LOS ANGELES,DEPT MAT SCI & ENGN,LOS ANGELES,CA 90024

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1988年 / 99卷 / 01期

关键词：

D O I：

10.1016/0022-3093(88)90466-8

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：140 / 150

页数：11

共 27 条

[1] X-RAY PHOTOEMISSION-STUDY OF FLUOROZIRCONATE GLASS AND RELATED CRYSTALS [J].

ALMEIDA, RM ;

LAU, J ;

MACKENZIE, JD .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1984, 69 (01) :161-165

[2]

ALMEIDA RM, 1985, MATER SCI FORUM, V6, P465

[3] XPS MEASUREMENTS AND STRUCTURAL ASPECTS OF SILICATE AND PHOSPHATE-GLASSES [J].

BRUCKNER, R ;

CHUN, HU ;

GORETZKI, H ;

SAMMET, M .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1980, 42 (1-3) :49-60

[4]

CHEN KC, 1986, J NON-CRYST SOLIDS, V81, P227, DOI 10.1016/0022-3093(86)90272-3

[5]

Goretzki, 1978, GLASTECH BER, V51, P1

[6] X-RAY PHOTOELECTRON-SPECTROSCOPY OF SODIUM-PHOSPHATE GLASSES [J].

GRESCH, R ;

MULLERWARMUTH, W ;

DUTZ, H .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 34 (01) :127-136

[7]

HEO J, IN PRESS

[8]

Kaneko Y., 1978, Yogyo-Kyokai-Shi, V86, P330, DOI 10.2109/jcersj1950.86.995_330

[9] COORDINATION-NUMBER OF DOPED BORON ATOMS IN PHOTOCHEMICALLY-DEPOSITED AMORPHOUS-SILICON STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

KAZAHAYA, T ;

HIROSE, M .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1986, 25 (01) :L75-L77

[10] GLASSES FROM MELTS AND GLASSES FROM GELS, A COMPARISON [J].

MACKENZIE, JD .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1982, 48 (01) :1-10

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