FUNDAMENTAL LIMITS IN DIGITAL INFORMATION-PROCESSING

[1] HOT-CARRIER INSTABILITY IN IGFETS [J]. APPLIED PHYSICS LETTERS, 1975, 27 (03) : 147 - 148

[2] BEALL RJ, 1974, 1974 INTERCON TECHN

[3] Belady L.A, 1979, RES DIRECTIONS SOFTW

[4] LOGICAL REVERSIBILITY OF COMPUTATION [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1973, 17 (06) : 525 - 532

[5] 1500 GATE, RANDOM LOGIC, LARGE-SCALE INTEGRATED (LSI) MASTERSLICE [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (05) : 818 - 822

[6] CHIBA T, 1978, IEEE T COMPUT, V27, P319, DOI 10.1109/TC.1978.1675104

[7] EXCESS CURRENT GENERATION DUE TO REVERSE BIAS P-N JUNCTION STRESS [J]. APPLIED PHYSICS LETTERS, 1968, 13 (08) : 264 - &

[8] TEMPERATURE DEPENDENCE OF AVALANCHE MULTIPLICATION IN SEMICONDUCTORS [J]. APPLIED PHYSICS LETTERS, 1966, 9 (06) : 242 - &

[9] DHeurle F. M., 1973, PHYS THIN FILMS, V7, P257

[10] DONATH WE, RC4610 IBM RES REP

[1] HOT-CARRIER INSTABILITY IN IGFETS [J]. APPLIED PHYSICS LETTERS, 1975, 27 (03) : 147 - 148

[2] BEALL RJ, 1974, 1974 INTERCON TECHN

[3] Belady L.A, 1979, RES DIRECTIONS SOFTW

[4] LOGICAL REVERSIBILITY OF COMPUTATION [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1973, 17 (06) : 525 - 532

[5] 1500 GATE, RANDOM LOGIC, LARGE-SCALE INTEGRATED (LSI) MASTERSLICE [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (05) : 818 - 822

[6] CHIBA T, 1978, IEEE T COMPUT, V27, P319, DOI 10.1109/TC.1978.1675104

[7] EXCESS CURRENT GENERATION DUE TO REVERSE BIAS P-N JUNCTION STRESS [J]. APPLIED PHYSICS LETTERS, 1968, 13 (08) : 264 - &

[8] TEMPERATURE DEPENDENCE OF AVALANCHE MULTIPLICATION IN SEMICONDUCTORS [J]. APPLIED PHYSICS LETTERS, 1966, 9 (06) : 242 - &

[9] DHeurle F. M., 1973, PHYS THIN FILMS, V7, P257

[10] DONATH WE, RC4610 IBM RES REP