TRACE-ELEMENT DETECTION SENSITIVITY IN PIXE ANALYSIS BY MEANS OF AN EXTERNAL PROTON-BEAM

被引：17

作者：

RAITH, B

WILDE, HR

ROTH, M

STRATMANN, A

GONSIOR, B

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1980年 / 168卷 / 1-3期

关键词：

D O I：

10.1016/0029-554X(80)91262-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：251 / 257

页数：7

共 13 条

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[8] TRACE-ELEMENT ANALYSIS BY ION INDUCED X-RAY-EMISSION SPECTROSCOPY [J].

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[9]

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[10] TRACE-ELEMENT ANALYSIS BY X-RAY-FLUORESCENCE WITH AN EXTERNAL PROTON-BEAM [J].

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