EPITAXIAL-GROWTH OF (001) AL ON (111) SI BY VAPOR-DEPOSITION

被引:23
作者
THANGARAI, N
WESTMACOTT, KH
DAHMEN, U
机构
[1] National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, Berkeley
关键词
D O I
10.1063/1.107726
中图分类号
O59 [应用物理学];
学科分类号
摘要
Heteroepitaxial growth of (001) Al thin films on Si (111) single crystal substrates by vapor deposition was studied by means of x-ray diffraction, Rutherford backscattering spectrometry, and transmission electron microscopy techniques. It was observed that the films deposited at room temperature exhibit random (111) texture, while the films deposited at 280-degrees-C show perfect epitaxial alignment of (001) Al planes with (111) Si planes. In the interface plane [110] close packed directions in both the film and the substrate are parallel and hence Al grows with three orientation variants in a unique mazed tricrystal arrangement.
引用
收藏
页码:913 / 915
页数:3
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