FIELD-IONIZATION OF DEEP LEVELS IN SEMICONDUCTORS WITH APPLICATIONS TO HG1-XCDX TE P-N-JUNCTIONS

被引:76
作者
ANDERSON, WW
HOFFMAN, HJ
机构
关键词
D O I
10.1063/1.330425
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:9130 / 9145
页数:16
相关论文
共 48 条
[1]   TUNNEL CURRENT LIMITATIONS OF NARROW BANDGAP IR CHARGE COUPLED DEVICES [J].
ANDERSON, WW .
INFRARED PHYSICS, 1977, 17 (02) :147-164
[2]   ABSORPTION CONSTANT OF PB1-XSNXTE AND HG1-XCDXTE ALLOYS [J].
ANDERSON, WW .
INFRARED PHYSICS, 1980, 20 (06) :363-372
[3]  
ANDERSON WW, 1980, IRIS DETECTOR SPECIA
[4]   RECOMBINATION IN CADMIUM MERCURY TELLURIDE PHOTODETECTORS [J].
BAKER, IM ;
CAPOCCI, FA ;
CHARLTON, DE ;
WOTHERSPOON, JTM .
SOLID-STATE ELECTRONICS, 1978, 21 (11-1) :1475-1480
[5]   LOW-TEMPERATURE FIELD-IONIZATION OF LOCALIZED IMPURITY LEVELS IN SEMICONDUCTORS [J].
BANAVAR, JR ;
COON, DD ;
DERKITS, GE .
APPLIED PHYSICS LETTERS, 1979, 34 (01) :94-96
[6]  
BLAKEMORE JS, 1962, SEMICONDUCTOR STATIS, P218
[7]  
Bloch A., 1977, MURPHYS LAW OTHER RE
[8]   INTERFACE RECOMBINATION PHENOMENA AND TUNNEL EFFECT IN CU2S-CDS SOLAR-CELLS [J].
BORDURE, G ;
ELADIOUI, M ;
LLINARES, C .
SOLAR ENERGY MATERIALS, 1980, 2 (02) :229-237
[9]   CALCULATION OF THE AUGER LIFETIME IN PARA-TYPE HG1-XCDXTE [J].
CASSELMAN, TN .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (02) :848-854
[10]   QUANTUM-MECHANICAL ESTIMATES OF THE SPEED OF FIELD-IONIZATION OF SHALLOW IMPURITY LEVELS [J].
CHAUDHURI, S ;
COON, DD ;
DERKITS, GE .
APPLIED PHYSICS LETTERS, 1980, 37 (01) :111-113