THE WIEN FILTER AND ITS APPLICATION IN CHEMISTRY

被引：10

作者：

ABERTH, W ^{[1
]}

WOLLNIK, H ^{[1
]}

机构：

[1] UNIV GIESSEN,INST PHYSIOL,W-6300 GIESSEN,GERMANY

来源：

MASS SPECTROMETRY REVIEWS | 1990年 / 9卷 / 04期

关键词：

D O I：

10.1002/mas.1280090402

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

[No abstract available]

引用

页码：383 / 404

页数：22

共 45 条

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ABERTH, W .

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[3] MICROCHANNEL PLATE FOR SURFACE-INDUCED DISSOCIATION IN MASS-SPECTROMETRY [J].

ABERTH, W .

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[4] CHARACTERISTICS OF A VOLCANO FIELD-IONIZATION SOURCE-MASS SPECTROMETER OPERATING AT 30 KV ACCELERATING VOLTAGE [J].

ABERTH, W .

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[5]

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[6]

ABERTH W, 1980, INT J MASS SPECTROM, V37, P379

[7]

ABERTH W, 1974, ADV MASS SPECTROM, P437

[8]

ABERTH W, 1988, 36TH P ASMS C MASS S, P73

[9]

ABERTH W, 1982, ANAL CHEM, V54, P2929

[10] EFFECT OF PRIMARY BEAM ENERGY ON THE SECONDARY ION SPUTTERING EFFICIENCY OF LIQUID SECONDARY IONIZATION MASS-SPECTROMETRY IN THE 5-30-KEV RANGE [J].

ABERTH, WH ;

BURLINGAME, AL .

ANALYTICAL CHEMISTRY, 1988, 60 (14) :1426-1428

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