ELECTRICAL BREAKDOWN AND PITTING IN ANODIC FILMS ON TUNGSTEN IN HALOGEN ION-CONTAINING SOLUTIONS

被引:12
作者
DIQUARTO, F
PIAZZA, S
SUNSERI, C
机构
来源
JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1988年 / 248卷 / 01期
关键词
D O I
10.1016/0022-0728(88)85155-6
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:117 / 129
页数:13
相关论文
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