(111)CDTE SURFACE-STRUCTURE - A STUDY BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION, X-RAY PHOTOELECTRON-SPECTROSCOPY, AND X-RAY PHOTOELECTRON DIFFRACTION

被引:23
作者
DUSZAK, R
TATARENKO, S
CIBERT, J
SAMINADAYAR, K
DESHAYES, C
机构
[1] UNIV JOSEPH FOURIER,SPECTROMET PHYS LAB,CNRS,F-38402 ST MARTIN DHERES,FRANCE
[2] CEN,PHYS SEMICOND LAB,DRF,MC-SP2M,F-38041 GRENOBLE,FRANCE
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1991年 / 9卷 / 06期
关键词
D O I
10.1116/1.577167
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The (111BAR) CdTe surface is studied by reflection high energy electron diffraction, x-ray photoelectron spectroscopy, and x-ray photoelectron diffraction (XRD). Several surface reconstructions are described. Shifts in the Cd (3d) binding energy levels allow separation of contribution of surface Cd atoms from that of the bulk. While bulk atoms exhibit XPD effects along the standard crystallographic directions, for surface atoms the diffraction effects occur along distinct directions which correspond to an outwards relaxation of the topmost Te layer. These findings are consistent with a recently proposed model of the CdTe (111BAR) surface.
引用
收藏
页码:3025 / 3030
页数:6
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