X-RAY-MEASUREMENT OF MINUTE LATTICE STRAIN IN PERFECT SILICON-CRYSTALS

被引：49

作者：

BONSE, U

HARTMANN, I

机构：

来源：

ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 1981年 / 156卷 / 3-4期

关键词：

D O I：

10.1524/zkri.1981.156.3-4.265

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：265 / 279

页数：15

共 40 条

[1] ETCH PITS OBSERVED IN DISLOCATION-FREE SILICON CRYSTALS
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[3] SIMPLE BRAGG-SPACING COMPARATOR
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[4] EFFECT OF CARBON ON LATTICE PARAMETER OF SILICON
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TUCKER, TN
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BUSCHERT, RC
[J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (09) : 4365 - &
[5] TEST MEASUREMENTS WITH A PERFECT CRYSTAL NEUTRON INTERFEROMETER
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[J]. ZEITSCHRIFT FUR PHYSIK, 1974, 271 (02): : 177 - 182
[6] COMPARISON BETWEEN EXPERIMENTAL AND THEORETICAL DISLOCATION IMAGE FOR BRAGG CASE
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BUBAKOVA, R
SOUREK, Z
[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1976, 36 (02): : 509 - 516
[7] CONTRAST OF DISLOCATION IMAGE IN BRAGG CASE
BEDYNSKA, T
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1973, 18 (01): : 147 - 154
[8] TEM OBSERVATION OF DISLOCATION LOOPS CORRELATED WITH INDIVIDUAL SWIRL DEFECTS IN AS-GROWN SILICON
BERNEWITZ, LI
KOLBESEN, BO
MAYER, KR
SCHUH, GE
[J]. APPLIED PHYSICS LETTERS, 1974, 25 (05) : 277 - 279
[9] BERNEWITZ LI, 1973, PHYS STATUS SOLIDI A, V16, P579, DOI 10.1002/pssa.2210160228
[10] X-RAY INTERFEROMETRY AND LATTICE-PARAMETER INVESTIGATION
BONSE, U
GRAEFF, W
MATERLIK, G
[J]. REVUE DE PHYSIQUE APPLIQUEE, 1976, 11 (01): : 83 - 87

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