HYDROGEN-RADICAL ANNEALING OF CHEMICAL VAPOR-DEPOSITED AMORPHOUS-SILICON FILMS

被引:20
作者
UCHIDA, Y [1 ]
KANOH, H [1 ]
SUGIURA, O [1 ]
MATSUMURA, M [1 ]
机构
[1] TOKYO INST TECHNOL, DEPT PHYS ELECTR, MEGURO KU, TOKYO 152, JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1990年 / 29卷 / 12期
关键词
AMORPHOUS SILICON; HYDROGEN-RADICAL ANNEALING; PHOTOCONDUCTOR; TFT; MOBILITY;
D O I
10.1143/JJAP.29.L2171
中图分类号
O59 [应用物理学];
学科分类号
摘要
This letter describes that photogenerated hydrogen-radical annealing (HRA) is very effective for improving the electric properties of chemical-vapor-deposited amorphous silicon films. The ratio of photoconductivity to dark conductivity (at a light intensity of 100 mW/cm2) changed from 100 to 6 X 10(4) upon annealing in a hydrogen-radical-rich ambient at 280-degrees-C. Thin-film transistor (TFT) characteristics were also improved by HRA.
引用
收藏
页码:L2171 / L2173
页数:3
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