MEASUREMENT OF THE WORK FUNCTION OF SOME METALS USING INTERNAL VOLTAGE IN MIM STRUCTURES

被引:12
作者
GUPTA, SK [1 ]
KAPIL, AK [1 ]
SINGAL, CM [1 ]
SRIVASTAVA, VK [1 ]
机构
[1] UNIV ROORKEE, DEPT PHYS, ROORKEE 247672, INDIA
关键词
D O I
10.1063/1.326199
中图分类号
O59 [应用物理学];
学科分类号
摘要
Work functions of some metals (Mg, Mn, Cr, Bi, Cd, Pb, Te, Zn, and Sn) have been determined by using the zero-bias internal-voltage technique in asymmetric electrodes structures of metal/insulator/metal systems. The built-up Langmuir films of barium-stearate have been used as an insulator in these structures, as the thicknesses of the multilayer Langmuir films are known accurately and the effect of the thickness dependence of the internal voltage can be corrected for when obtaining a work function from internal-voltage measurements. Any contribution arising due to alumina (Al2O3) film on base aluminum electrodes has also been accounted for, to give the correct value of the work function. The measured values of the work function by this technique are found to be in agreement with the known data.
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页码:2852 / 2855
页数:4
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