SURFACE-STATES IN SI(111)2X1 AND GE(111)2X1 BY OPTICAL REFLECTIVITY

被引：66

作者：

NANNARONE, S ^{[1
]}

CHIARADIA, P ^{[1
]}

CICCACCI, F ^{[1
]}

MEMEO, R ^{[1
]}

SASSAROLI, P ^{[1
]}

SELCI, S ^{[1
]}

CHIAROTTI, G ^{[1
]}

机构：

[1] CNR,GRP NAZL STRUTT MAT,ROME,ITALY

来源：

关键词：

D O I：

10.1016/0038-1098(80)90731-0

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：593 / 595

页数：3

共 19 条

[1] ELECTRONIC-STRUCTURE OF SOLID-SURFACES
APPELBAUM, JA
HAMANN, DR
[J]. REVIEWS OF MODERN PHYSICS, 1976, 48 (03) : 479 - 496
[2] SURFACE-STATES ON SI (111) 2 X 1 DETECTED BY EXTERNAL REFLECTIVITY
CHIARADIA, P
CHIAROTTI, G
NANNARONE, S
SASSAROLI, P
[J]. SOLID STATE COMMUNICATIONS, 1978, 26 (11) : 813 - 815
[3] CHIARADIA P, 1978, 14TH P INT C PHYS SE, P195
[4] OPTICAL ABSORPTION OF SURFACE STATES IN ULTRAHIGH VACUUM CLEAVED (111) SURFACES OF GE AND SI
CHIAROTTI, G
NANNARONE, S
PASTORE, R
CHIARADIA, P
[J]. PHYSICAL REVIEW B-SOLID STATE, 1971, 4 (10): : 3398 - +
[5] DELSOLE R, SOL ST COMM
[6] SURFACE OPTICAL-CONSTANTS OF SILICON AND GERMANIUM DERIVED FROM ELECTRON-ENERGY-LOSS SPECTROSCOPY
FROITZHEIM, H
IBACH, H
MILLS, DL
[J]. PHYSICAL REVIEW B, 1975, 11 (12): : 4980 - 4988
[7] Gudat W., 1978, Photoemission and the electronic properties of surfaces, P315
[8] ELECTRONIC-STRUCTURE OF CLEAVED CLEAN AND OXYGEN-COVERED GAAS (110) SURFACES
LUTH, H
BUCHEL, M
DORN, R
LIEHR, M
MATZ, R
[J]. PHYSICAL REVIEW B, 1977, 15 (02): : 865 - 874
[9] DIFFERENTIAL REFLECTION SPECTROSCOPY OF VERY THIN SURFACE FILMS
MCINTYRE, JD
ASPNES, DE
[J]. SURFACE SCIENCE, 1971, 24 (02) : 417 - &
[10] ELLIPSOMETRY AND CLEAN SURFACES OF SILICON AND GERMANIUM
MEYER, F
DEKLUIZE.EE
BOOTSMA, GA
[J]. SURFACE SCIENCE, 1971, 27 (01) : 88 - +