NEW TECHNOLOGY FOR TAPERED WINDOWS IN INSULATING FILMS

被引:6
作者
ONO, H
TANGO, H
机构
[1] Toshiba Corporation, Toshiba Research and Development Center, Kawasaki
关键词
D O I
10.1149/1.2129073
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
[No abstract available]
引用
收藏
页码:504 / 506
页数:3
相关论文
共 4 条
[1]   TAPERED WINDOWS IN PHOSPHORUS-DOPED SIO2 BY ION-IMPLANTATION [J].
NORTH, JC ;
MCGAHAN, TE ;
RICE, DW ;
ADAMS, AC .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (07) :809-812
[2]  
ONO H, UNPUBLISHED
[3]   TAPERED WINDOWS IN SIO2 - EFFECT OF NH F-HF DILUTION AND ETCHING TEMPERATURE [J].
PARISI, GI ;
HASZKO, SE ;
ROZGONYI, GA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (06) :917-921
[4]   LOW-TEMPERATURE SILICON-NITRIDE DEPOSITION USING MICROWAVE-EXCITED ACTIVE NITROGEN [J].
SHIBAGAKI, M ;
HORIIKE, Y ;
YAMAZAKI, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 :215-221