COMMISSION-ON-CRYSTALLOGRAPHIC-APPARATUS - ACCURACY OF STRUCTURE FACTORS FROM X-RAY POWDER INTENSITY MEASUREMENTS

被引：62

作者：

SUORTTI, P

JENNINGS, LD

机构：

[1] UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND

[2] USA,MAT & MECH RES CTR,WATERTOWN,MA 02172

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1977年 / 33卷 / NOV期

关键词：

D O I：

10.1107/S0567739477002447

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：1012 / &

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