CHARGE-STATE MEASUREMENTS OF BACKSCATTERED IONS FROM AU FILMS

被引：10

作者：

ARAFAH, DE

MEYER, JD

SHARABATI, H

MAHMOUD, A

机构：

来源：

PHYSICAL REVIEW A | 1989年 / 39卷 / 08期

关键词：

D O I：

10.1103/PhysRevA.39.3836

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3836 / 3841

页数：6

共 16 条

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[16] ION-BEAM CRYSTALLOGRAPHY OF SILICON SURFACES .1. SI(100)-(1X1)2H [J].

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