EFFECT OF SUBSTRATE ORIENTATION ON CRYSTALLINE MICROSTRUCTURE OF HGTE, CDTE AND HGCDTE

被引：6

作者：

CINADER, G

RAIZMAN, A

ORON, M

机构：

[1] Department of Solid State Physics, Soreq Nuclear Research Center, Yavne

来源：

JOURNAL OF CRYSTAL GROWTH | 1990年 / 101卷 / 1-4期

关键词：

Cadmium Telluride - Mercury Telluride;

D O I：

10.1016/0022-0248(90)90958-N

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The crystalline microstructure of HgTe, CdTe and HgCdTe layers grown by MOCVD on CdTe and GaAs substrates has been found to be critically dependent on the orientation of the growing surface.CdTe layers grown on (111)A and (111)B orientations contain a large number of microtwins. However in the HgTe growth, twins were detected only in (111)A case. For ternary compounds the tendency of twinning in the (111)B orientation was found to be dependent on composition. Twin free Hg0.74Cd0.26Te layers have been grown. © 1989.

引用

页码：167 / 170

页数：4

共 7 条

[1] TEM STUDIES OF EPITAXIAL CDTE AND (HG, CD)TE GROWN BY MOVPE ON GAAS AND CDTE SUBSTRATES [J].