INSITU ULTRAVIOLET-LASER TREATMENT DURING PLASMA DEPOSITION FOR THE IMPROVEMENT OF FILM QUALITIES IN HYDROGENATED AMORPHOUS-SILICON

被引:15
作者
SUZUKI, A
TOYOSHIMA, Y
MCELHENY, PJ
MATSUDA, A
机构
[1] Electrotechnical Laboratory, Tsukuba, Ibaraki, 305
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1991年 / 30卷 / 5A期
关键词
ULTRAVIOLET LASER IRRADIATION; HYDROGENATED AMORPHOUS SILICON; PLASMA-ENHANCED CHEMICAL VAPOR DEPOSITION; PHOTOCONDUCTIVITY; OPTICAL GAP; HYDROGEN CONTENT;
D O I
10.1143/JJAP.30.L790
中图分类号
O59 [应用物理学];
学科分类号
摘要
Hydrogenated amorphous silicon (a-Si:H) films were prepared with ultraviolet laser irradiation to modify the growing surface during the plasma-enhanced chemical vapor deposition. Using this treatment, the photoconductivity was improved by three to four orders of magnitude in films deposited at substrate temperatures below 100-degrees-C. Additionally, the optical band gap remained unchanged with the in-situ laser treatment. Consequently, high quality a-Si:H films, characterized by high photoconductivity and wide optical gap, were obtained at low substrate temperatures.
引用
收藏
页码:L790 / L792
页数:3
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